뒹뛪뱴놱색ꓹ돦끪냩뫞뉺볒ꚡ 멋 굮 뒹뛪뭳덹뱴꒤ꅁ뱶암꡴닎늣ꕘ뙱ꪺꑀ귓궫굮ꙝ꿀결놱색ꓹꙢ뭳ꭾꓴ럇ꅃ륌ꕨꪺ곣ꡳ뗛궫꧳Ꙣ놱색ꓹ떥꿅뷕궰ꪺ냝썄ꑗꅁꯜꓖ끷맯놱색ꓹ꒧Ꙣ뭳ꭾꓴ럇곣ꡳꅃꙝꚹꖻ곣ꡳꕄ굮ꗘꪺꙢ꧳땯깩놱색ꓹ뙧듁껉뚡뭐Ꙣ뭳ꭾꓴ럇꒧꛴군볒ꚡꅃ꣤꒤ꚳ꣢귓엜볆꿇ꑊꛒ뙱ꅁ꓀ꝏ결ꙁꙞ걹뉶놱색ꓹ믝ꡄ뉶ꅃꛓꖻ곣ꡳꙢ꧔ꚡꗍ늣샴맒ꑕꅁ꒣ꛒ뱻떥꿅뷕궰냝썄ꅁ땯깩돦끪냩ꙁꙞ걹면뫢ꩫ꣓꛴군놱색ꓹ뙧듁껉뚡뭐Ꙣ뭳ꭾꓴ럇ꅃꙢ맪엧ꑵ뱴ꗍ늣샴맒ꑕꅁꯘ멣ꕘꑀ덳ꛪ볒샀맪엧ꅁ꣓쏒ꧺ꧒뒣ꕘꪺ면뫢ꩫꪺꚨ껄ꅃ곣ꡳ떲ꩇ엣ꗜ꧒땯깩ꪺ면뫢ꩫ맯꧳꛴군놱색ꓹ뙧듁껉뚡Ꙣ뭳ꭾꓴ럇ꛓꢥꅁ걏곛럭ꚳꚨ껄ꪺꅃ 쏶쇤꙲ꅇ뒹뛪뱴ꅂ놱색ꓹꅂꙢ뭳ꭾꅂ돦끪냩ꅂꙁꙞ걹ꑀꅂ 뫼 뷗 뒹뛪뭳덹뱴꒤덺륌놱뻗ꓹꪺ꣏ꗎꅁꕩ륆꣬ꝙ껉낻듺뻷ꕸ뭳땻ꥍ뫻꯹ꕛꑵ샴맒뭐꯹쓲둸놱뒹뛪ꑀ덳ꛪ뫫녋뭳땻꒧뙩ꛦꅃꙝꚹ놱뻗ꓹꪺ꣏ꗎꅁꕩꚳ껄ꪺ둸놱뻷ꕸ꒧뭳땻꿠ꑏꅁ궰ꝃ꒣뉶ꪺ늣ꗍꅃ땍ꛓ놱뻗ꓹꪺ꣏ꗎꅁꑝꓞ땯굴궱ꪺ뱶암ꅃ꣤ꕄ굮냝썄Ꙣ꧳놱뻗ꓹ결뭳땻꿠ꑏ뫊듺뭐뫻꯹꒧ꑵ꣣ꅁ굙뻷ꕸ꿊ꕆ빁럭ꪺ놱뻗ꓹꅁ룓뻷ꕸ꒧ꗍ늣ꡂ왊녎덑궢꒤쉟ꅁ뙩ꛓꓞ땯늣ꕘ듮ꓖ뭐ꗍ늣덗릺ꩩ냊꒧ꕩ꿠꧊ꅃ결ꑆ쇗ꝋꑗ굺놡ꩰ꒧땯ꗍꅁ꧳걏럇돆ꑪ뙱ꪺ놱뻗ꓹꕈ꣑꣏ꗎꅃꛓ껚뻚맪믚뭐뱴냓던뷍ꪺ떲ꩇꅁ땯뉻놱뻗ꓹꙢ뭳ꭾ꙳덦곹뻣뱴Ꙣ뭳ꭾ꙳덦ꪺ30%~50%꒧뚡[1]ꅃ ꙝꚹꖻꓥ맯꧳놱뻗ꓹꅁ땯깩ꑀꙢ뭳ꭾ꛴뫢볒ꚡꅃꙢ뒹뛪ꪺꗍ늣꒣ꛜ꧳꒤쉟꒧뇸ꗳꑕꅁ빁껉ꪺ뒣꣑놱뻗ꓹꅁꚳ껄ꪺ꛴뫢놱뻗ꓹꪺꓴ럇ꣃ듮ꝃ놱뻗ꓹ맯늣ꭾꗍ늣꒧뱶암ꅃ 1
뒹뛪뱴놱색ꓹ돦끪냩뫞뉺볒ꚡ Chen and Lee[2]뻚놱색ꓹ꒧궰꿅ꓨꚡꅁꕈ뇀ꚡ뭐꧔ꚡ꣢뫘면뫢ꩫ꣓뿯뻜놱색ꓹ룻꣎꒧궰꿅룴뵵ꅃ떲ꩇ엣ꗜꕈ꧔ꚡ궰꿅ꓨꚡꕩꚳ껄ꪺ듮ꓖ놱색ꓹ꣏ꗎ꒧뻷ꕸ낱뻷껉뚡ꅁꛓ뇀ꚡ궰꿅ꓨꚡꕩ뱗ꕛ놱색ꓹꝑꗎ꒧ꚸ볆ꅃ Ꙣ꧔ꚡꗍ늣덗릺놱꣮꒤ꅁ Spearman[3]꧳1990꙾롧ꗑ곝ꪺ귗ꖿꅁ땯깩ꕘ꧒뿗ꪺCONWIP꡴닎ꅃSpearman왛맮뛇닎꒧곝꡴닎ꅁꖲ뚷끷맯ꙕ뫘꒣Ꙑ꒧ꑵꗳꥷ롱꒣Ꙑ꒧곝ꅁ럭ꑵꗳ뫘쏾륌꧳썥ꑪ껉ꅁ꙳꧱ꑵꗳ꒧볐럇깥뺹녎ꗎꑪ뙱꒧뱴꧐뚡ꅁꣃꕂꑝ깥꧶덹ꚨ륌낪꒧Ꙣ뭳ꭾ꙳덦ꅃꙢCONWIP꡴닎ꑕꅁ굙꣏ꑀꞹ뻣꒧ꗍ늣뵵뛈꣏ꗎꑀ뫘곝ꅁꕂWIP 뙱뫻꯹ꥷꅁꑵꗳ뇽뙩ꑊꗍ늣뵵껉ꅁ닄ꑀꡂ왊꒧ꑵꝀ꾸ꖲ뚷굮ꚳ곝ꅁ ꛓꕂꚹꑀ곝쁈ꑵꗳ걹롧뻣귓Ꝁ띾걹땻ꅁ꧳ꑵꗳꞹꚨꕛꑵꯡ녎룓곝쓀Ꙟ꧳닄ꑀ귓ꑵꝀ꾸ꅃ곛룻꒧ꑕꅁCONWIP꒧놱꣮룻곝결꧶ꅃ ꚹꕾLawrance[4]녎ꗍ늣뙧듁껉뚡륷듺볒ꚡꅁ냏꓀결맪쏒룪껆꓀꩒ꩫꅂ볒샀ꩫ볆귈꓀꩒ꩫꅃGlynn떥ꑈ[5]Raddon & Grigsby[6]ꭨ녎뙧듁껉뚡륷듺ꩫꅁ꓀ꚨ볒샀ꅂ떥귔뉺뷗뭐닎군끪쉫꓀꩒ꩫꅃ꣤꒤볒샀ꩫ덱녠ꭙ녎ꗍ늣꡴닎ꪺ샴맒ꅂꕛꑵꓨꚡꅂ뻷ꕸ꽓꧊떥곛쏶꽓꧊ꅁ꣏ꗎ볒샀덮엩ꯘ멣ꚨ볒샀볒닕꣏꣤뭐뉻돵ꗍ늣꡴닎ꚳ곛Ꙑ꒧꽓꧊ꅁ뙩ꛓ녯꣬ꗍ늣뙧듁껉뚡ꅂꙢ뭳ꭾꓴ럇ꅂꝑꗎ뉶떥뉻돵룪끔ꅃ볒샀ꩫꪺ쁵쉉결꿠삳뉻돵ꪺꪬꩰꅁꕈ낵결륷듺ꗍ늣셚껄ꡍ떦ꓤ뒩꒧ꑵ꣣ꅃꛓ닎군꓀꩒ꩫꑄꝑꗎ끪쉫꓀꩒걏엜늧볆꓀꩒떥곛쏶닎군ꓨꩫꅁ꓀꩒뙧듁껉뚡뭐ꙕ쏾엜볆꒧뚡ꪺ쏶ꭙꅁꣃꚹꯘꗟ닎군볒ꮬ꣓뙩ꛦ륷듺ꅃ Wang 떥[7]ꖩꞮꪺ떲Ꙙ꣢귓ꗑ떥귔뉺뷗꧒뇀뻉ꕘ꒧꒽ꚡꅇLittle’s formula (L=ꍦW)[8]Kingman’s equation[9]ꅁ뇀ꕘꙕꑵꝀ꾸뙧듁껉뚡꒧끪쉫ꓨ땻ꚡꅃꛜ꧳볆귈꓀꩒ꓨꩫꅁꭨ걏ꕈ떥귔뉺뷗결냲슦ꅁꝑꗎ볆뻇볒ꚡ뇀뻉굱돦ꪺ걹냊껉뚡꣤볐럇깴ꅁ뙩ꛓꝑꗎ녠멁꓀끴ꪺ낲덝꣓덝ꥷ꧒믝ꪺ냑볆ꅃ꧒ꕈꚹꩫꪺ쁵쉉걏군뫢껉뚡룻땵ꅂ룻슲ꭋꅁꣃꕂꕩꕈ떹꒩압ꯈꑀ닊늤꒧ꗍ늣뙧듁껉뚡ꅁꕈꝀ결ꩁ냈꒧냲럇ꅆ꿊쉉걏ꅁ슲꓆꒧볆뻇볒ꚡꦹꦹ때ꩫ삳맪믚ꪺꗍ늣ꪬꩰꅁꛓꕂ럭볒ꚡ곛럭뷆싸껉ꅁꭨ꒣꧶뇀뻉ꅃ 땍ꛓꑗ굺ꙕ뫘ꓨꩫꅁ곒ꖼ녎놱색ꓹ맯꧳뉻돵놱꣮꒧뱶암꿇ꑊꛒ뱻ꅁ놱색ꓹ냝썄ꑄ걏뒹뛪뱴궫굮ꪺ뭳땻꽓꧊ꅃꙝꚹꖻꓥ삳ꗎ돦끪냩볒ꚡꅁꛒ뱻놱색ꓹꙁꙞ걹꒧꽓꧊ꅁ꣓덝ꥷꙕ떥꿅꒧Ꙣ뭳ꭾꓴ럇ꅁꕈ닅Ꙙ돌ꑰꚨꖻ꒧ꗍ늣ꓨꚡꅃ ꖻꓥ냏꓀꙰ꑕꅇ닄ꑇ론걏꒶닐놱뻗ꓹꗍ늣샴맒ꅁ닄ꑔ론걏멣ꯘ놱뻗ꓹ돦끪냩ꙁꙞ걹볒ꚡꅁ닄ꕼ론결맪꣒엧뗽뭐꓀꩒ꅁ닄꒭론뒣ꕘ떲뷗뭐ꖼ꣓곣ꡳꓨꙖꅃ 2
ISSN 1812-8572 (2004)군뙱뫞뉺듁ꕚvol. 1, no. 1, page 1~12 ꑇꅂ 놱색ꓹ꒧ꗍ늣샴맒 뒹뛪뭳덹뱴ꪺ뭳덹걹땻꙰맏ꑀ꧒ꗜ[10]ꅁꕩ꓀ꚨꕛ볶뭳땻ꅂ띌뱶뭳땻ꅂ뭫꣨ꅂ싷ꑬꝇ듓ꅂ꒶륱ꑬ송붤ꅂ꓆뻇곣뽩ꅂ쓝꓆떥뭳땻ꅃ꣤꒤꣏ꗎ놱색ꓹ꒧ꗘꪺꙢ꧳ꅁ뫊놱늣ꭾ걹땻ꅂ뻷ꕸ뭳땻냑볆ꅂ럭뻷뫻앀뭐륷ꢾꭏ빩ꅃꛓ놱ꓹꕄ굮Ꙣ꧳ꙕ냏뙱듺꣤띌닉ꝴ뙱뭐ꭰꯗꅃꙢ뛀ꗺ냏꣤뙱듺꒧뚵ꗘ결쏶쇤ꯗꅂ맯땊ꯗꅂ썮ꗺꯗꅂꗺ뉇ꭰꯗ뭐ꞡ꓃ꯗꅆꙢ쑬뫞냏꣤뙱듺뚵ꗘꕝ걁뻷ꕸ띌닉ꝴ뙱뭐송붤ꭰꯗꅁꚹꕾ믝굮색ꓹ꣓뛱몡껦뭐ꢾꓮ볶뿧깧ꑺ쉚뭳땻ꅃ ꡃ륄뒹뛪뭳덹꒧ꕛꑵ샴맒ꣃꭄ곛Ꙑꅁ결뵔ꭏ뒹뛪ꕛꑵ륌땻닅Ꙙ뭳땻덗껦ꅁ꧒ꕈ맯꧳꒣Ꙑꪺꕛꑵ샴맒ꅁꖲ뚷꣏ꗎ꒣Ꙑ꽓꧊ꪺ놱색ꓹꅃꕂꑀ놱색ꓹ라뗸꣤ꭾ뷨ꪬ멁ꅁ궫뷆꣏ꗎ꧳룓ꗍ늣뻷ꕸꅁꪽ꣬놱ꓹ꣤볤뉢ꯗ뭐ꭰꯗ꒣닅Ꙙ뭳땻굮ꡄꛓ덑궰꿅돸뱯ꅃ결쇗ꝋ꣏ꗎ뿹뭾ꪺ놱ꓹꛓ덹ꚨ뻷ꕸꛃ걖ꅁ뒹뛪뱴럓ꕛꑵ뻷ꕸ샴맒꒧믝ꡄꅁ녎삳ꗎ꧳꒣Ꙑ뻷뫘ꪺ놱색ꓹꕈ떥꿅ꅝgradeꅞ랧꧀냏꓀ꅃ놱색ꓹ꣏ꗎꑗꕴꑀ꽓꧊결꣣ꚳꕼ귓꣏ꗎ걹땻ꅁ꧒뿗ꪺꕼ귓꣏ꗎ걹땻꓀ꝏ결ꅇꭥꛦꝀ띾ꅝpre-dispositionꅞꅂ껸꿓꣏ꗎꅝin-useꅞꅂꙞꚬꝀ띾ꅝrecycleꅞꅁ뭐곣뽩Ꝁ띾ꅝreclaimꅞꅁ슲뫙PURR1ꅃꅹꭥꛦꝀ띾ꅺꅂꅹ껸꿓꣏ꗎꅺ뭐ꅹꙞꚬꝀ띾ꅺ떥ꑔ뚵걹땻Ꝁ띾ꭨꙘ뫙결PUR1걹땻ꅝ낣ꑆ곣뽩Ꝁ띾reclaimꕾꅞ꙰맏ꑇ꧒ꗜꅃ꣤꒤Pꫭꗜ떥꿅j꒧놱색ꓹ꒧ꭥꛦꝀ띾ꡂ왊ꅁUꫭꗜ떥꿅j꒧놱색ꓹ꒧껸꿓꣏ꗎꡂ왊ꅁjjRꫭꗜ떥꿅j꒧놱색ꓹ꒧ꙞꚬꝀ띾ꡂ왊ꅁaꫭꗜ떥꿅j꒧띳ꓹ꣑삳뉶ꅁꍦꫭꗜ떥꿅j꒧j0jj놱색ꓹ꣬륆뉶ꅁꍦꫭꗜ떥꿅j꒧놱색ꓹꙁꙞ걹꣬륆뉶ꅃ jj ꟷ껆뒹뛪뭳덹뱴듺룕꓆뻇뻷쓝꓆꒶륱뷨송붤뇱곣뽩뒹뛪ꯊ룋ꕛ볶뭳땻싷ꑬꝇ듓뭫꣨ꗺꅝ쑬뫞냏ꅞꗺ귩낣귩낣ꗺ롮띌뱶뭳땻돌닗듺룕(뛀ꗺ냏)IC 덝군맏ꑀ 뒹뛪뭳덹뱴꒧걛멣맏 3
뒹뛪뱴놱색ꓹ돦끪냩뫞뉺볒ꚡ Rjλjjλjj??慤j攠a0jPjUjλλλ??汬†???????jjj 맏ꑇ 놱색ꓹ떥꿅j꒧PURꝀ띾걹땻2 ꚹꕾ떲ꙘꙁꙞ걹뭐궰꿅꒧랧꧀ꯡꅁꚨꑀꙨ떥꿅뫴룴볒ꚡꅁ꙰맏ꑔ꧒ꗜꅃ꣤꒤Sꫭꗜ놱색ꓹꪺ끟ꥬ쉉ꅝ띳ꓹ꣑삳ꅞꅁFꫭꗜ놱색ꓹꪺ떲ꟴ쉉ꅝ돸뱯ꚬ뚰ꅞꅁaꫭꗜꙕ떥꿅0jj꒧띳ꓹ꣑삳뉶ꅁdꫭꗜꙕ떥꿅j꒧믝ꡄ뉶ꅁPꫭꗜ떥꿅j꒧ꙁꙞ걹ꓱ뉶ꅁꍦꫭꗜ떥꿅jjjijj꒧궰꿅꣬륆뉶ꅁꍦꫭꗜ떥꿅j꒧돸뱯뉶ꅃ ꗑ꧳놱뻗ꓹꪺ꣏ꗎ덗ꭨꑑ꓀꽓껭ꅁ뭐ꗍ늣jD꡴닎꒧륂Ꝁꚳ뷆싸ꪺꗦ꒬Ꝁꗎ(떥꿅ꅂꙁꙞ걹ꅂ궰꿅ꅂꙷꗾ꙳뙱)ꅃ맯꧳놱뻗ꓹꪺ꙳덦뫞뉺볒ꚡꅁ뇽ꑀꚸꝙꛒ뱻꣤꧒ꚳ놱뻗ꓹꪺ꽓꧊ꛓ멣ꯘꅁ걏ꑀꗳ꒣깥꧶ꪺꑵ땻ꅃ꧒ꕈ결ꑆ엣ꗜꖻ볒ꚡ꒧엣뗛꧊ꅁꖻꓥ낲덝Ꙣ몡ꢬꙕ떥꿅놱뻗ꓹ믝ꡄꪺꭥ뒣ꑕꅁꕈ돦끪냩ꙁꙞ걹볒ꚡꅝ꒣ꛒ뱻ꙷꗾ꙳뙱뭐떥꿅뷕궰,ꍦ=0,맯꧳i<jꅞ꙰맏ꑇ꧒ꗜꅁ꣓ꡍꥷꙕ떥꿅놱뻗ꓹ꒧뙧ij듁껉뚡뭐Ꙣ뭳ꭾꓴ럇ꅃ ꍦ22ꇗꍦ2ꇑP22a02Grade 2ꍦ2ꍦ11ꇗꍦ1ꇑP11d 2a0jꍦ12ꇗꍦ1ꇑP12a01Grade 1ꍦ23ꇗꍦ2ꇑP23ꍦ1Sd 1ꍦ33ꇗꍦ3ꇑP33ꍦ2Dꇗꍦ2ꇑP2Dꍦ13ꇗꍦ1ꇑP13Grade jGrade 3d jꍦ3ad 3ꍦjDꇗꍦjꇑPjD03ꍦ3Dꇗꍦ3ꇑP3DFꍦ1Dꇗꍦ1ꇑP1Dꍦ? 맏ꑔ 놱뻗ꓹꙨ떥꿅꒧뫴룴볒ꚡꗜ띎맏2 4
ISSN 1812-8572 (2004)군뙱뫞뉺듁ꕚvol. 1, no. 1, page 1~12 ꑔꅂ놱뻗ꓹ돦끪냩ꙁꙞ걹볒ꚡ멣ꯘ ꖻꓥ꧒뒣ꕘꪺꅵ돦끪냩ꙁꙞ걹꛴뫢ꩫ(Single-loop Re-entrant Estimation Methodology; SREM)ꅶꅁ꣤ꕄ굮꓀결맪믚뙧듁껉뚡뭐Ꙣ뭳ꭾꓴ럇꛴뫢꣢뎡꓀ꅃ꣤꒤뙧듁껉뚡ꅁꭙ놱색ꓹ녱뙩ꑊPUR걹땻ꛜ싷뙽PUR걹땻결ꓮ꒧껉뚡ꯗꅃꛓꙢ뭳ꭾꓴ럇ꅁꭙ놱색ꓹꙢPUR걹땻꒤꒧볆뙱ꅃ 맯꧳맪믚뙧듁껉뚡ꅁ꙰맏ꑇ꧒ꫭꗜꅁꙢ꒣ꛒ뱻ꙷꗾ꙳뙱뭐궰꿅뱶암ꑕꅁ럭놱색ꓹ뙩ꑊPUR걹땻꧒뚷ꪺ껉뚡ꅁ꓀결ꙁꙞ걹떥귔껉뚡뭐뉺뷗뙧듁껉뚡꣢귓뎡꓀ꅁꣃ꙰ꑕ꧒굺ꅇ 1.ꙁꙞ걹떥귔껉뚡ꅇT Q놱색ꓹ롧륌PUR걹땻ꯡꙁꙞ걹뙩ꑊPUR걹땻꧒덹ꚨ꒧떥귔껉뚡ꅃ꣤꒤맯꧳ꙕ떥꿅꒧ꙁꙞ걹떥귔껉뚡ꅁ궺ꗽꛒ뱻뙩ꑊPUR걹땻ꪺ껉뚡뭐꣤곛맯꧳PUR덴뉶꒧껉뚡깴늧ꅁ꣤ꚸꛒ뱻꣤ꕩ꿠땯ꗍ꒧ꚸ볆ꅁ꧒ꕈ꣤꛴군ꚡ꙰ꚡ(1)ꅃ Pk111jj (1) T=−−−×,j=1,2,...λµµµ1−pjj1j2j3jj1111럭 0≤++≤,k=1µµµλj1j2j3j11112 ≤++≤,k=2λµµµλj1j2j3j.. . n−1111n ≤++≤,k=nλµµµλj1j2j3j꣤꒤Tꫭꗜ떥꿅jꪺꙁꙞ걹떥귔껉뚡ꅁλꫭꗜ떥꿅jꪺ꣬륆뉶ꅁµꫭꗜ떥꿅jꪺꭥꛦꝀQjjj1띾ꩁ냈뉶ꅁµꫭꗜ떥꿅jꪺ껸꿓꣏ꗎ뉶ꅁµꫭꗜ떥꿅jꪺꙞ걹Ꝁ띾ꩁ냈뉶ꅁPꫭꗜj2j3jj떥꿅jꪺꙁꙞ걹ꓱ꣒ꅁKꫭꗜꙁꙞ걹껉뚡냑볆ꅃ 2.뉺뷗뙧듁껉뚡ꅒT P뉺뷗뙧듁껉뚡ꕝꝴ꿂뭳땻껉뚡ꅂ룼ꑊ뭐꣸ꑕ껉뚡ꅋ떥떥ꅁ꣤꛴군ꚡ꙰ꚡ(2)ꅃ 5
뒹뛪뱴놱색ꓹ돦끪냩뫞뉺볒ꚡ p11111 (2) jjT=×+×+×,j=1,2,...µ1−pµ1−pµ1−pj1jjj2jjj3jj꣤꒤Tꫭꗜ떥꿅jꪺ뉺뷗뙧듁껉뚡ꅃ Pjꗑꚡ(1)뭐ꚡ(2)ꕩꪾꅁ놱색ꓹ걹롧PUR걹땻꒧맪믚뙧듁껉뚡ꅝCTꅞꅁ떥꧳T뭐TQP꒧ꥍꅁ꙰꒽ꚡ(3)꧒ꗜꅃ pP11111jjk111 , jjCT=×+×+×+−−−×ju1−pµ1−pµ1−pλµµµ1−pj1jjj2jjj3jjjj1j2j3jj j=…c. (3) CT꣤꒤jꫭꗜ떥꿅jꪺ맪믚뙧듁껉뚡ꅃ ꚹꕾ놱색ꓹ꒧Ꙣ뭳ꭾꗑLittle’s formula (WIP=λ×CT)ꅁꕩ뇀뻉꣤Ꙣ뭳ꭾꓴ럇결ꑕꚡꅇ WIP=λ×(1−P)×CT, j=…c. (4) jjjjj꣤꒤ꅇWIPꫭꗜ떥꿅jꪺ놱색ꓹ꒧Ꙣ뭳ꭾꓴ럇ꅃ j ꕼꅂ맪꣒룕엧뭐볒샀꓀꩒ ꖻ론녎뇄ꗎ맪꣒룕엧볒샀꓀꩒꣓엧쏒면뫢ꩫ꒧ꚨ껄ꅃ궺ꗽ둹굺냲ꖻ뿩ꑊ룪껆ꅁꕝ걁ꙕ뚵ꗍ늣샴맒ꪺ낲덝뭐놱뻗ꓹ꒧곛쏶룪끔ꅆ꣤ꚸꝑꗎ뿩ꑊꪺ룪껆ꅁ꣓군뫢ꙕ떥꿅놱뻗ꓹꪺ뙧듁껉뚡뭐Ꙣ뭳ꭾꓴ럇ꅁꣃꕈMaple꣓군뫢SREMꪺ꛴군귈ꅃꙁꕈeM-Plant꣓ꯘ멣놱색ꓹ꒧돦끪냩ꙁꙞ걹샴맒ꅁꣃ녎꣢꒧떲ꩇ낵꓀꩒뭐ꓱ룻ꅃ꣤궫쉉Ꙣ꧳꒣뱶암꡴닎늣ꕘ뇸ꗳꑕꅁꕈ떥꿅1결ꕎꫭ꣓군뫢ꅝ꣤ꕌ떥꿅쏾ꅞꅁ맯꧳꒣Ꙑꪺ믝ꡄ뙱ꅁꕈ꒣ꙐꪺꙁꙞ걹뉶ꅁ놱색ꓹ꒧뙧듁껉뚡뭐Ꙣ뭳ꭾꓴ럇ꅁ꣓ꓱ룻꣢꒧깴늧ꅃ 냲ꖻ룪껆뿩ꑊ ꖻꓥ꒧룪껆ꕄ굮꣓ꛛ꧳맪엧ꯇ멣ꯘꪺ뒹뛪뱴ꅁ꣤룪껆롧뻣뉺ꯡ꙰ꑕ꧒ꗜꅇ 1.늣ꭾ냲ꖻ룪껆ꅇꖻꗍ늣꡴닎꒤ꅁꙀꗍ늣AꅂBꅂCꅂDꅂE꒭뫘늣ꭾꅁꕂꕩ꓀결꣢뫘늣ꭾ뇚ꅇAꅂB결엞뿨륱룴ꅁCꅂDꅂE결끏뻐엩ꅃꙕ늣ꭾ뭳땻곛늧ꕂꞡ뛈ꚳ돦ꑀ뫘뭳땻ꅁꛓꙕ뭳땻ꡂ왊꧒꣏ꗎꪺꑵꝀ꾸꣤ꕛꑵ껉뚡ꞡ결 6
ISSN 1812-8572 (2004)군뙱뫞뉺듁ꕚvol. 1, no. 1, page 1~12 ꑷꪾꅃ 2.ꑵꝀ꾸냲ꖻ룪껆ꅇꖻꗍ늣꡴닎꒤ꅁ놱색ꓹꪺPUR걹땻꧒믝꒧ꑵꝀ꾸결ꑷꪾꅁꣃꕂ꒣라뱶암꣬ꖿ녠늣ꭾꪺ늣ꕘꅃ 3.ꑵꝀ꾸럭뻷껉뚡ꅇ꧒ꚳꑵꝀ꾸ꝏꪺꖭꞡ럭뻷뚡륪껉뚡ꅝMTBFꅞ뭐ꖭꞡ럭뻷귗둟껉뚡ꅝMTTRꅞ녎볆꓀끴꒩ꕈ떹ꥷꅃ 4.ꗍ늣겡냊놱꣮ꅇ결꧔ꓳ놱꣮꡴닎ꅁ럭뉻돵ꡓꚳ놱색ꓹ껉ꪽ놵꧔띳ꪺ놱색ꓹ꣏ꗎꅃ 5.놱뻗ꓹ꒧룪껆ꅇ떥꿅1꒧놱색ꓹ꣤PUR걹땻ꩁ냈덴뉶꙰ꫭꑀ꧒ꗜꅃ 맪엧떲ꩇ뭐꓀꩒ ꖻ곣ꡳ걏Ꙣꛒ뱻꒣Ꙑ믝ꡄ뭐꒣ꙐꙁꙞ걹뉶뇸ꗳꑕ(믝ꡄ뉶ꗑ4ꗳ/ꓑꛜ14ꗳ/ꓑꅁꡃꚸ뱗ꕛ1ꗳ;ꙁꙞ걹뉶ꗑꛜꅁꡃꚸ뱗ꕛ) ꅁ꓀ꝏꕈSREMꩫꥍ볒샀ꩫꅁ군뫢떥꿅1꒧놱색ꓹꪺ뙧듁껉뚡뭐Ꙣ뭳ꭾꓴ럇ꅁ꣤떲ꩇ꙰ꫭꑇ뭐ꫭꑔ꧒ꗜꅃ꣤꒤맏꒭ꪺ뙧듁껉뚡ꅁ걏ꕈSREMꩫ군뫢ꅁ맏꒻걏ꕈ볒샀ꩫꫭꗜꅃꛓꗑꫭꑇꕩꪾꅁ꣤뙧듁껉뚡꒧떴맯깴늧ꛊ꓀ꓱ돌ꑪ결%ꅁ돌ꑰ결%ꅃ꣤꒤맏ꑃꪺꙢ뭳ꭾꓴ럇ꅁ걏ꕈSREMꩫ군뫢ꅁ맏꒻걏ꕈ볒샀ꩫꫭꗜꅃꛓꗑꫭꑔꕩꪾꅁ꣤Ꙣ뭳ꭾꓴ럇꒧떴맯깴늧ꛊ꓀ꓱ돌ꑪ결%ꅁ돌ꑰ결%ꅃ 맏꒭ 떥꿅1ꪺ놱색ꓹ뙧듁껉뚡ꙢSREMꩫꑕ믝ꡄ뉶=4(1)14ꥍ ꙁꙞ걹뉶=(). 7
뒹뛪뱴놱색ꓹ돦끪냩뫞뉺볒ꚡ 맏꒻ 떥꿅1ꪺ놱색ꓹ뙧듁껉뚡Ꙣ볒샀ꑕ믝ꡄ뉶=4(1)14ꥍ ꙁꙞ걹뉶=(). 맏ꑃ 떥꿅1ꪺ놱색ꓹꙢ뭳ꭾꓴ럇ꙢSREMꩫꑕ믝ꡄ뉶=4(1)14ꥍꙁꙞ걹뉶=(). 맏ꑋ 떥꿅1ꪺ놱색ꓹꙢ뭳ꭾꓴ럇Ꙣ볒샀ꩫꑕ믝ꡄ뉶=4(1)14ꥍꙁꙞ걹뉶=(). ꒭ꅂ떲뷗뭐ꖼ꣓곣ꡳꓨꙖ ꖻ곣ꡳꪺꛒ뙱ꅁꙢ몡ꢬꙕ떥꿅놱뻗ꓹꪺ믝ꡄꭥ뒣ꑕꅁꕈ돦끪냩ꙁꙞ걹꛴뫢ꩫ(SREM)ꡍꥷ룓떥꿅꒧놱뻗ꓹ뙧듁껉뚡뭐Ꙣ뭳ꭾꓴ럇ꅃꛓꗑ맪엧꒧떲ꩇꕩꪾꅁSREM맯꧳뙧듁껉뚡ꥍꙢ뭳ꭾꓴ럇꒧꛴뫢ꅁ뭐볒샀떲ꩇ꒧떴맯깴늧Ꙣ5%꒧꒺ꅃꛓ꧳맪믚ꗍ늣샴맒꒤ꅁꗍ뫞ꑈ귻ꕩ럓ꖻ볒닕꧒뒣꣑꒧Ꙣ뭳ꭾ뙱ꅁꝀ결놱색ꓹ뫞꣮꒧냲슦ꅃ꧒ꕈꖻ볒닕꧒덝ꥷ꒧놱뻗ꓹ뙧듁껉뚡뭐Ꙣ뭳ꭾꓴ럇ꅁ꧳뉻돵ꗍ늣걆떦끴Ꙙ꒧뇸ꗳꑕꅁ꿠ꚳ껄ꪺ궰ꝃ놱뻗ꓹꓴ 8
ISSN 1812-8572 (2004)군뙱뫞뉺듁ꕚvol. 1, no. 1, page 1~12 럇ꣃ뫻꯹꡴닎ꖿ녠ꗍ늣꒧ꚨ껄ꅃ 맯꧳ꖻꓥꥼꚳꕈꑕ볆쉉귈녯Ꝁꟳ뉠ꑊ놴끑ꅃ궺ꗽ걏ꅁꖻ곣ꡳ놱뻗ꓹꙢ뭳ꭾ꙳덦볒ꚡ꒧뵤돲뛈궭꧳ꅹ돦끪냩ꙁꙞ걹뫴룴볒ꚡꅺꅁ땍ꛓ맪믚놱뻗ꓹ뷕궰ꩫꭨ삳결Ꙩ떥꿅ꅁ결ꡄꚳ껄ꪺ꣏ꗎ놱뻗ꓹꅁ삳ꯘꗟꑀ귓ꅹꙨ떥꿅끪냩뫴룴볒ꚡꅺꅃ꣤ꚸ걏ꅁꙕ떥꿅놱색ꓹ꒧ꚨꖻ꒣Ꙑꅁꙝꚹ꙰꛳Ꙣ돌ꑰꚨꖻꗘ볐ꑕꅁ꣓ꡍꥷꙕ떥꿅꒧궰꿅뉶ꅂꙁꙞ걹뉶ꅂ뭐ꙷꗾ꙳덦ꓴ럇ꅁꭨ결ꖼ꣓곣ꡳ꒧ꓨꙖꅃ 냑ꛒꓥ쑭 1. Y. L. Lin, 2000, The design of inventory control model for dummy/control wafers at the furnace area in the wafer fab., Master Thesis, National Chiao Tung University, Hsin-Chu, Taiwan. 2. H. C. Chen & C. E. Lee, 2000, “Control and dummy wafers management,” Journal of the Chinese Institute of Industrial Engineer”, vol. 17, no. 4, -449. 3. M. L. Spearman, & D. L. Woodurff, 1990, “CONWIP: A pull alternative to kanban,” International Journal of Production Research, vol 28, no. 5, -894. 4. S. R. Lawrence, 1995, “Estimating flowtimes and setting due-dates in complex production systems,” IIE Transactions, -668. 5. P. M. Glynn, et al. “How to get predictable throughput times in a multiple product environment,” IEEE/, -30, 1997. 6. A. Raddon & B. Grigsby, 1997, “Throughput time forecasting model,” 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, -433. 7. T. H. Wang, K. C. Lin & S. R. Huang, 1997, “Method of Dynamically Determining Cycle Time of a Working Stage,” 1997 IEEE/CPMT Int’l Electronics Manufacturing Technology Symposium, pp. 403-407. 8. F. S. Hiller & G. J. Lieberman, 1995, Introduction to Operations Research, Sixth Edition, McGrraw-Hill Publishing Company, USA. 9. L. Kleinrock, 1975, Queueing System, John Willey & Sons, USA 10. H. Xiao, 2001, Introduction to semiconductor manufacturing technology, Prentice-Hall Inc., USA. 9
뒹뛪뱴놱색ꓹ돦끪냩뫞뉺볒ꚡ ꫭꑀ PUR걹땻ꪺꩁ냈덴뉶 (돦ꛬꅇꗳ/ꓑ) Loop1 uu u 11 1213ꖭꞡ귈222 15 25 볐럇깴 ꫭꑇ 떥꿅1ꪺ놱색ꓹ뙧듁껉뚡ꙢSREM뭐볒샀ꩫꑕ믝ꡄ뉶=4(1)14ꥍ ꙁꙞ걹뉶=().(Unit: Hour) Ratio Demand SREM . (%) . (%) . (%) . (%) . (%) . (%) . (%) . (%) . (%) . (%) . (%) 10
ISSN 1812-8572 (2004)군뙱뫞뉺듁ꕚvol. 1, no. 1, page 1~12 * . (discrepancy ratio) (%) ꪺꥷ롱결ꅇ (SREM귈 – 볒샀귈)/( 볒샀귈)*100%. ꫭꑔ 떥꿅1ꪺ놱색ꓹꙢ뭳ꭾꓴ럇ꙢSREM뭐볒샀ꩫꑕ믝ꡄ뉶=4(1)14ꥍꙁꙞ걹뉶=(). (Unit: Lot) RatioDemand SREM . (%) . (%) . (%) . (%) . (%) . (%) . (%) . (%) . (%) . (%) . (%) 11
뒹뛪뱴놱색ꓹ돦끪냩뫞뉺볒ꚡ Single Loop Management System for Control Wafers in The Wafer Fabrication *Shu-Hsing Chung **Amy Hsin-I Lee *Chih-Wei Lai *Department of Industrial Engineering and Management National Chiao Tung University **Department of Industrial Management Chung Hua University **E-mail: amylee@ ?Abstract An important factor affecting the production throughput in the wafer fabrication factory is the work-in-process (WIP) level of control wafers. Previous research work has focused on control wafers downgrading problem, and little work has been done for WIP level of control wafers. The objective of this paper is to develop methods for estimating the WIP level of control wafers for each grade. Two variables are considered, the re-entrant ratio and the demand rate. Under pulling control production environment, a single-loop algorithm is developed for estimating the WIP control wafers. We conduct some simulation experiments based on a laboratory factory production environment to demonstrate the effectiveness of the proposed algorithm. The results show that the algorithm is an efficient tool for estimating the cycle time and WIP level for control wafers. Keywords: wafer fabrication, control/dummy wafers, WIP, single-loop, re-entrant. 12
